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2. PROCESS CONTROL
AUTOMATIC CONTROL LOOP MONITORING AND DIAGNOSTICS

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Patent status:
Countries
Status
Issued
Issue #
US
Issued
11/17/1998
5838561
EP/DE/ES/FI/FR/SE,
Issued
6/26/2002
0 907 913 B1
CA
Issued
12/19/2000
2252868

PATENT ABSTRACT [Paprican Ref. No. 4124]

A method of diagnosing a malfunction of a process control system which includes at least one closed loop control loop comprising measuring a histogram of tracking error of the control loop, determining distortion of the tracking error relative to a Gaussian distribution, and indicating a malfunction in the process in the event a deviation from the Gaussian distribution of the tracking error exceeds predetermined limits.


Available Electronic Files(s) in the language of patent filed:

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